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Joao Gaspar

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Joao Gaspar
Gegend:
79110 Freiburg, Germany
Arbeit:
Group Leader / Assistant
Organisationen:
Institute of Electrical & Electronics Engineers (IEEE) ** Materials Research Society (MRS) ** International Research Group of Nano and Micro Systems (NAMIS)
Hochschulen:
 Dept. Microsystems Eng. (IMTEK), Univ. of Freiburg, Germany (Microsystems Technology, Post-Doc), INESC Microsystems and Nanotechnologies, Lisbon, Portugal (Materials Engineering, Ph.D.), Instituto Superior Tecnico (IST), Technical Univ. Lisbon, Portugal (Technological Physics Engineering, Licenciatura)
Status:
Employee
Sprachen:
English (Fluent), Portuguese (First language), Spanish (Fluent), French (Basic knowledge), German (Basic knowledge)
Berufserfahrung:
  (Group Leader / Assistant), Dept. Microsystems Eng. (IMTEK), Univ. Freiburg, Germany,  (Post-Doctoral Fellow), INESC Microsystems and Nanotechnologies, Lisbon, Portugal,  (Graduate Student), Dept. Physics, Instituto Superior Tecnico, Technical University of Lisbon,  (Teaching Assistant), INESC Solid State Technology Group, Lisbon, Portugal,  (Und...
Ich suche:
Contacts, ideas dealing with microsystems technology (MST) and microelectromechanical systems (MEMS), development of sensors and actuators, process and device reliability, automation of related fabrication and characterization tools
Ich biete:
Solid background in physics engineering and technology ** Significant experience in modeling, design, fabrication technology, testing and characterization of MEMS materials and devices (passive structures, sensors and actuators using mechanical, electrostatic, magnetic, piezoresistive, thermal and optical principles) ** Experience in implementing and developing MEMS and ICs characterization tools ...
Interessen:
Microelectromechanical systems: Implementation of novel principles for sensors and actuators, optical applications and RF engineering, energy harvesting ** Technology development for micromechanical devices, including post-CMOS processing and flexible electronics applications ** Implementation of automated testing techniques: wafer-scale methods for characterization of MEMS devices and material pr...
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